Device Details
Optical Profilometer
Main Purpose :
Axio CSM 700 makes measuring the radii and angles of metallic components in the micrometer range easy. You can analyze the surface roughness of small areas or profiles.

Topographic measurement precision better than 0.1 µm in lateral direction and 0.02 µm in height. You can measure the thickness of transparent layers quickly and without physical contact, then use measurements to draw conclusions about the surface roughness, color, brilliance and other properties. You can examine polymers that are too soft to be measured with physical contact.

In addition to surface roughness, your Axio CSM 700 analyzes structures beneath the surface in layers, allowing you to document inhomogeneities, voids and inclusions.

Device Category: Class 1000

Device Location : ITUnano Cleanroom